The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Dec. 06, 1996
Hidenobu Ishida, Shiga, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
The following arrangement is adopted to achieve an X-ray spectroscope capable of simultaneously spectrally analyzing, with a single spectral scanning, X-rays emitted from a point-like X-ray source in a plurality of wavelength ranges such that X-rays in a wide wavelength range can spectrally be analyzed with a single spectral scanning. In an X-ray spectroscope in which a point-like X-ray source, a spectral crystal and a X-ray detector are disposed along a Rowland circle and in which, with the distance between the X-ray source and the spectral crystal maintained equal to the distance between the spectral crystal and the X-ray detector, this distance is continuously changed such that the wavelength of X-rays to be spectrally analyzed is continuously changed, the X-ray spectroscope is characterized in that the spectral crystal comprises a plurality of arcuate crystals for spectrally analyzing respective X-rays different in wavelength, that at least one of the arcuate crystals is located at a position apart from the reference plane including the Rowland circle and that the X-ray detector comprises at least one X-ray detector for detecting the X-rays diffracted by the arcuate crystals.