The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Sep. 11, 1996
Applicant:
Inventors:
Michiharu Abe, Kanagawa, JP;
Hiroko Iwasaki, Tokyo, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369116 ;
Abstract
An optical data recording/reproducing method in which data is recorded for testing in a pattern including a not-recorded section and a recorded section as changing a recording power P onto an optical data recording medium from time to time, An amplitude m of the recorded data corresponding to the recording power P is monitored by reproducing the data recorded for testing. A standardized gradient g(P) is calculated from the following expression: