The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Nov. 04, 1996
C David Wang, Melville, NY (US);
Robert Howard Kagann, Cumming, GA (US);
AIL Systems, Inc., Deer Park, NY (US);
Abstract
An improved open-path fast Fourier infrared spectrometer includes a circuit or algorithm which performs real-time, spectral alignment on measured interferograms to reduce measuremental errors. The improved spectrometer measures selected water vapor lines in a measurement path and compares the centerline of these measured water vapor lines to a reference library. From two or more such comparisons within the spectrometer bandwidth, the spectrometer calculates correction factors for the entire bandwidth. The improved spectrometer performs an overlap and add algorithm which applies the correction factors to perform bandwidth segment-specific shifts on subsequently measured interferograms.