The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
May. 13, 1996
Applicant:
Inventors:
Assignees:
Hitachi, Ltd., Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
324314 ; 324309 ;
Abstract
In an inspecting method based on nuclear magnetic resonance, a burst wave having a plurality of sub-pulses frequency-modulated with a high frequency is generated, the burst wave is amplitude-modulated with at least a function which repeats polarity inversion, the amplitude-modulated burst wave is irradiated, as an exciting high frequency pulse, to an object to be inspected, and gradient magnetic fields are generated in predetermined pulse sequence to measure a nuclear magnetic resonance signal.