The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1998

Filed:

Jul. 01, 1997
Applicant:
Inventors:

Yoshiaki Kato, Mito, JP;

Tadao Mimura, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250288 ;
Abstract

An eluant is supplied to an analyzer column, a sample solution is supplied through a sample inlet. The analyzer column separates the components of the sample solution. The separated components are eluted by the analyzer column, the eluted components are detected by an eluted component detector, the results of detection provided by the eluted component detector is processed by a data processor to produce a liquid chromatogram having peaks indicating the components of the sample. The components of the sample is supplied through a capillary pipe to an ion source and the ion source ionizes the components of the sample. A mass spectrometer subjects the ions produced by the ion source to mass analysis, an ion detector detects the ions included in a mass spectrum to produce an ion chromatogram having peaks. A time difference between the chromatograms is determined beforehand through an experiment using a standard sample, and the liquid chromatogram is shifted on its time axis by the time difference.


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