The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Sep. 12, 1996
Bill H Quon, Aliso Viejo, CA (US);
Paul S Lee, La Palma, CA (US);
Steven W Fornaca, Torrance, CA (US);
Karen E Yokoyama, Rancho Palos Verdes, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A method of calibrating gains and offsets for a two-dimensional detector array 10 comprising individual detector elements 14, including: (a) focusing a first incoming image signal at a first power level onto the detector array 10; (b) reading the corresponding electrical signals from the detector elements 14 as a first image frame at the first power level; (c) for each detector element 14, translating the first incoming image signal by a detector element distance onto an adjacent detector element; (d) reading the corresponding electrical signal from the detector elements 14 as a second image frame at the first power level; (e) focusing a second incoming image signal at a second power level onto the detector array 10; (f) reading the corresponding electrical signals from the detector elements 14 as a first image frame at the second power level; (g) for each detector element 14, translating the second incoming image signal by a detector element distance onto an adjacent detector element; (h) reading the corresponding electrical signals from the detector elements 14 as a second image frame at the second power level; (i) selecting a reference detector element 18; (j) determining the gain of detector elements adjacent to the reference detector element 18; and (k) determining the offset of the adjacent detector elements 14.