The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1998

Filed:

Aug. 02, 1996
Applicant:
Inventors:

Konan Peck, Taipei, TW;

Pan-Chyr Yang, Taipei, TW;

Shu-Li Wung, Taipei Hsien, TW;

Assignee:

Academia Sinica, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 435-72 ; 435-721 ; 435-731 ; 435-732 ; 435-791 ; 435 32 ; 436518 ; 436530 ; 436809 ; 536 253 ; 536 2531 ; 536 2532 ; 536 254 ; 536 2541 ; 356201 ; 356442 ;
Abstract

The present invention discloses a method for rapid antimicrobial susceptibility testing to screen antibiotics in a few hours instead of days by conventional methods. This method can also be used to identify susceptible antibiotics to treat mycobacterial infection in a few days instead of the usual six to eight weeks. Fast screening of antibiotics is achieved by a short period of specimen incubation in different antibiotics embedded media to create differential bacterial counts. The differences of bacterial counts among antibiotics embedded media are subsequently amplified by DNA amplification methods for detection. Following DNA amplification, rapid quantitation and minimum inhibition concentration (MIC) determinations for a panel of antibiotics are achieved in less than one minute by fluorescence quantitation methods.


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