The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Feb. 29, 1996
Applicant:
Inventor:
Frederic Zenhausern, Mohegan Lake, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B44C / ;
U.S. Cl.
CPC ...
216-2 ; 216 41 ; 216 56 ; 216 60 ; 216 85 ;
Abstract
A method for microscopical observation of an amorphous specimen. The method comprises the steps of providing a substrate having at least one outer surface that defines an optically flat and predetermined geometric configuration, including at least one discontinuity; disposing an amorphous specimen in contact with the discontinuity of the substrate; and, selecting a virtual focus point which can act as a referent point on a defocus position axis, thereby maximizing the phase-contrast of the specimen.