The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
May. 17, 1996
Thomas Huetter, Niederrohrdorf, CH;
Urs Joerimann, Bertschikon, CH;
Hans-Georg Wiedemann, Staefa, CH;
Mettler-Toledo GmbH, Greifensee, CH;
Abstract
A method and apparatus for performing single differential thermal analysis of a sample relative to a reference, using either one reference measurement for a sequence of material measurements--whereby the reference can also be represented by an empty weighing pan--or by the use of a mathmematical model which is so determined that it takes the real behavior of the thermal analytical apparatus into account. Reference temperature curves are generated relative to time of an empty furnace or a reference sample contained in the furnace, and temperature curves of a sample to be measured are taken at the exact same location in the furnace. The reference and sample temperature curves are compared to determine the temperature difference. The reference temperature curve can be calculated mathematically from the measured furnace temperature and the heat transmission factor between the furnace temperature and the temperature of the location of the sample in the furnace, whereby it is possible to determine the differential thermal analysis by a single measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile