The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
Jun. 20, 1996
Shih-Jong J Lee, Bellevue, WA (US);
Seho Oh, Mukilteo, WA (US);
Chih-Chau L Kuan, Redmond, WA (US);
Dayle G Ellison, Redmond, WA (US);
Wendy R Bannister, Seattle, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
Reference information for a biological slide is obtained. The reference information normalizes the measured object features. Calibrated feature measurement, not based on absolute measurements, self adjusts to match the situation of each slide, where each slide is characterized by the reference information. The reference may be different from slide to slide because of the preparation variations. The calibrated features will not carry the inter-slide variations. In addition, the reference information provides a good indication of the slide condition such as dark stained, air dried, etc. which can be used as slide features for the specimen classification. No alteration of the current practice of specimen preparation is required. The many slide context dependent features improve the classification accuracy of the objects in a specimen.