The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
Mar. 21, 1996
Georg Geus, Wiesbaden, DE;
Heimann Systems GmbH, , DE;
Abstract
A method and apparatus is provided for identifying crystalline and polycrystalline material in an object placed in an examination region. X-rays having a polychromatic energy distribution are passed through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object. The x-rays are diffracted by individual subregions of the object along the cross section in dependence of the presence of crystalline and/or polycrystalline material in the individual subregions. Collimators with collimating windows are arranged beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object. Energy spectra of the diffracted x-ray plane fan beams exiting the respective one of the collimating windows are captured with a detector located behind each of the collimating windows for converting the captured energy spectra into signals usable in a data processing arrangement.