The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
Jun. 06, 1996
Delbert Raymond Cecchi, Rochester, MN (US);
Marius V Dina, Burnsville, MN (US);
Curtis Walter Preuss, Rochester, MN (US);
Kenneth Michael Valk, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus that can test self-timed parallel interfaces operating at system speed. An output stage is provided for queuing a test packet and providing the test packet to an input stage. The packet contains a data bit stream and error detection code such as cyclic redundancy check code. The input stage is coupled to the output stage and receives the test packet to determine the correctness of the data bit stream. On the input stage, the error detection code verifier recalculates the error detection code and compares the recalculated error detection code with the error detection code attached to the data bit stream to determine the correctness of the data bit steam. The output queue has a first input port for receiving data from drivers on the interface and a second input port for receiving a pseudo random data bit stream. A pseudo random data generator generates a pseudo random data bit stream. The data bit stream may be packetized according to a predetermined protocol. An off-chip signal of the output stage may be provided to the inputs of the input stage to produce an on-chip copy of off-chip data.