The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1998

Filed:

Feb. 06, 1997
Applicant:
Inventor:

Seiki Goto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01P / ;
U.S. Cl.
CPC ...
333 33 ; 330 51 ; 330286 ;
Abstract

An impedance matching circuit disposed on one of input and output sides of an element to be evaluated matches I/O impedances of the element. The impedance matching circuit includes a matching substrate having a surface, a main line on the surface, passive circuits having stubs and FETs alternatingly connected in series and electrically connected to the main line to change impedance of the main line, and a plurality of switching FETs connected in series between the main line and the respective passive circuits switched on and off in accordance with characteristics of the element. The impedances of the matching substrate can be changed as required by electrically connecting the passive circuit to the main line by switching of the FETs. Even when a considerable change occurs in the I/O impedances of the element due to fabrication variations and in large signal (non-linear) operation of a power FET, I/O impedances of an evaluating object can be matched easily and promptly by appropriate switching of the FETs.


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Goto, Seiki. (1998). Impedance matching circuit and thin film measuring prober (U.S. Patent No. 5786737). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5786737

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