The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1998

Filed:

Dec. 09, 1996
Applicant:
Inventors:

Takafumi Hayama, Ibaraki, JP;

Katsumi Irie, Kashihara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324770 ;
Abstract

In the case where a possible defect of a liquid crystal panel is detected, after the liquid crystal panel is put into an oven with the liquid crystal panel being energized, a second inspecting pulse, which has a larger potential difference than a potential difference of a first inspecting pulse applied to a second signal line on an active matrix substrate, is applied to a second signal line. In the above method, since an insulating layer, which is on the verge of breakage, between a source line and the second signal line can be broken, a possible defect of the liquid crystal panel can be detected as a cross bright line by inspection for turning-on in the panel inspecting step. For this reason, in this method, accuracy of detecting a possible defect can be improved, and the number of S-G leaks in the market is decreased greatly, thereby improving display quality of the liquid crystal panel.


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