The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
May. 17, 1996
Kaoru Terashima, Saitama-ken, JP;
Osamu Seshimoto, Saitama-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
The concentration of an analyte in a sample liquid is determined on the basis of the optical density of a chemical analysis element spotted with the sample liquid according to a standard curve representing the relation between the concentration and the optical density of the analysis element which is obtained when the concentration is measured using an analysis element of a first lot. A plurality of first standard liquids containing the analyte in known levels are spotted onto analysis elements of a second lot, the concentrations of the analyte in the first standard liquids are determined according to the standard curve and a first calibration curve for correcting the concentrations of the analyte is prepared. A plurality of second standard liquids containing the analyte in known levels are spotted onto analysis elements of the second lot, the concentrations of the analyte in the second standard liquids are determined according to the standard curve on the particular analysis system, the concentrations of the analyte in the second standard liquids thus determined are corrected according to the first calibration curve, and a second calibration curve for correcting the concentrations of the specific analyte in the second standard liquids thus corrected is prepared.