The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1998

Filed:

May. 28, 1993
Applicant:
Inventor:

Marianne Hsien-Ming Hsiung, Woodside, CA (US);

Assignee:

Apple Computer, Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518321 ;
Abstract

A dynamic adaptive sampling process for providing performance analysis on a computer system; the sampling process comprising the steps of: generating a profile tree comprising a hierarchy of one or more nodes, each node in the hierarchy comprises an array of counters, with each counter mapped to an associated range of memory locations in the computer memory. The process then receives a program counter value and searches the profile tree according to the hierarchy of nodes to locate an associated counter. The associated counter maps to a corresponding memory range of the finest partition which includes the memory location identified by the program counter value. The sampling process then detects whether the located counter exceeds a threshold value, wherein if the located counter exceeds the threshold value, then the sampling process further comprises modifying the profile tree. Wherein if the located counter does not exceed the threshold value, then incrementing that located counter.


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Hsiung, Marianne. (1998). Dynamic sampling profiler (U.S. Patent No. 5784554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5784554

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