The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1998

Filed:

Jun. 28, 1996
Applicant:
Inventor:

Gary W Ferguson, Burnaby, B.C., CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
359398 ; 359396 ; 4352884 ;
Abstract

A slide for depositing for observation material under a microscope comprising a mounting surface to receive material for observation and a removable layer on the mounting surface formed with at least one opening in the removable layer to define at least one exposed region on the mounting surface for retaining material to be observed when the removable layer is detached. The exposed region has definite boundaries and any material to be examined remaining on the slide is confined to the exposed region to facilitate examination of the slide by human visual identification or machine vision by making material easier to locate, by limiting material to regions appropriate for best observation (e.g. away from edges of the slide and coverglass), and by limiting the amount of material or area covered by material to permit quick and rigorous observation and analysis. A method for using slides according to the present invention is also disclosed.


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