The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1998

Filed:

Feb. 06, 1997
Applicant:
Inventors:

Willem G Ophey, Eindhoven, NL;

Gerard E Van Rosmalen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 356373 ; 3561522 ; 369 4414 ;
Abstract

A position detection system (80) is described for detecting movements of an object (20) in at least five degrees of freedom, which system comprises a radiation source (33), a beam splitter (36) for forming a first measuring sub-beam (45) and a second measuring sub-beam (50), a reflector (38) arranged in the path of one of these measuring beams (45, 50) and a composite radiation-sensitive detection system (60). The first measuring sub-beam (45) is used for detecting displacements along three mutually perpendicular axes (X, Y, Z), and the second measuring sub-beam (50) is used for detecting rotations about at least two of these axes.


Find Patent Forward Citations

Loading…