The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1998

Filed:

Dec. 12, 1996
Applicant:
Inventors:

Tsuguo Nanjo, Toyohashi, JP;

Yasumi Hikosaka, Gamagori, JP;

Masunori Kawamura, Nagoya, JP;

Assignee:

Nidek Co., Ltd, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351214 ; 351206 ; 351221 ;
Abstract

In an ophthalmic measurement apparatus providing optical systems for focusing-and-projecting a laser beam for use in measuring onto an anterior portion of an eye to be examined, and for receiving a scattered light by the internal tissues of the anterior portion of the eye by a scattered laser beam by guiding the scattered light to a photoelectric transducing element, and for measuring tissues and components in the internal parts of the anterior portion of the eye based on an output signal transmitted from the photoelectric transducing element, alignment is performed by advancing a cylindrical shaped lens for forming a laser beam to be a slit-shaped light bundle in a light path in laser beam projecting optical system with observing an image of a section of the anterior portion of the eye which is light-sectioned by a slit-shaped laser beam, or by scanning a laser beam by laser beam scanning device with observing an image of a section of the anterior portion of the eye which is light-sectioned by the scanned laser beam through observation optical system.


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