The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 1998
Filed:
May. 30, 1996
Hideyuki Shoji, Sagamihara, JP;
Shinichiro Hattori, Akishima, JP;
Masahide Kanno, Hachioji, JP;
Yasushi Namii, Hachioji, JP;
Masaru Shiraiwa, Hachioji, JP;
Kimihiko Nishioka, Hachioji, JP;
Nobuyuki Matsuura, Hino, JP;
Akira Kusumoto, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
N lines of line-shaped light are projected onto the object by means of a measuring light projecting lens. The light carrying the image of the object is passed through the eyepiece lens 17 in an endoscope 6 and the auxiliary lens 30 in a measuring head 11 and split into two beamlets by a beam splitter 31, with one beamlet being focused at a position coinciding with the entrance end faces of measuring light's position detecting fibers 33(l) to 33(m). The line-shaped light images of the object thus formed in positions coinciding with the entrance end faces of measuring light's position detecting fibers 33(l) to 33(m) are scanned linearly by those linearly aligned fibers as they are oscillated and driven by a fiber scanner 36. The scanned line-shaped light images are then subjected to the necessary signal processing in a signal processor circuit 35 such as to measure the three-dimensional configuration of the object.