The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1998

Filed:

Dec. 02, 1996
Applicant:
Inventor:

J Peter Glasson, Portsmouth, NH (US);

Assignee:

Metronics, Inc., Bedford, NH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364560 ; 364188 ; 33504 ;
Abstract

An object inspection system including a coordinate measuring device with a touch probe for inspecting an object having one or more feature types and a computer subsystem connected to the coordinate measuring device which stores the direction of movement and the coordinates of the probe at each contact of the probe with a feature on the object. There is an algorithm which automatically determines, from the direction of movement of the probe and the coordinates, the feature type defined by the coordinates.


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