The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1998

Filed:

Aug. 08, 1996
Applicant:
Inventors:

Werner Fuchs, Cospeda, DE;

Andreas Wolfram, Karlsburg, DE;

Karl-Heinz Bechstein, Jena, DE;

Klaus Dieter Salewski, Greifswald, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356349 ; 356358 ;
Abstract

An interferometer for absolute distance measurement with two lasers, one of which is tunable with respect to frequency. A device for collinear superposition of the laser beams is arranged downstream of the lasers. Further, interferometer units are provided whose optical path lengths differ from one another. An individual acousto-optical modulator (AOM) is arranged downstream of the device for superposing the beams. Light-conducting elements for guiding the beams are arranged between the AOM, between the AOM and at least one first beam splitter arranged downstream of the AOM, and between the light outputs of the first beam splitter and the light inputs of one or more interferometer units arranged downstream and/or within these interferometer units.


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