The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1998

Filed:

Jun. 17, 1996
Applicant:
Inventors:

Patrick Lee DeLaune, Houston, TX (US);

Kerry Kennedy Spilker, Houston, TX (US);

Alan Cameron Wright, Bellaire, TX (US);

Assignee:

Texaco Inc., White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
250255 ; 250301 ;
Abstract

A method for evaluating the API gravity of a sample of underground formation includes steps of:


Find Patent Forward Citations

DeLaune, Patrick. (1998). Api estimate using multiple fluorescence measurements (U.S. Patent No. 5780850). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5780850

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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