The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 1998
Filed:
Mar. 06, 1997
Klaus Peter Selig, Hechingen, DE;
Bizerba GmbH & Co. KG, Balingen, DE;
Abstract
In order, in a weighing device, in particular for use in high-resolution scales, comprising an elastically deformable force transducer, a sensor arrangement for converting the deformation of the force transducer caused on account of a force F acting on the force input section of the force transducer into an electrical weighing signal and a processing unit for calculating a weighing signal corrected by the hysteresis error of the force transducer, to be able to realize a correction of the hysteresis error even with the short-term load variations occurring in practice in high-resolution scales at an acceptable cost, it is suggested that the sensor arrangement comprise a first testing unit for the high-resolution determination of the weighing signal 'S' and a second testing unit for the determination of the elastic deformation of the force transducer in small time increments (high time resolution), wherein the processing unit corrects the high-resolution weighing signal of the first testing unit by the hysteresis error on the basis of data made available by the second testing unit.