The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 1998

Filed:

Feb. 01, 1996
Applicant:
Inventors:

Adoram Erell, Herzelia, IL;

David Burshtein, Tel Aviv, IL;

Assignee:

DSPC Israel Ltd., Givat Shmuel, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L / ;
U.S. Cl.
CPC ...
704256 ; 704241 ; 704260 ; 704236 ;
Abstract

A pattern recognition system and method is disclosed. The method includes the steps of a) providing a noisy test feature set of the input signal, a plurality of reference feature sets of reference templates produced in a quiet environment, and a background noise feature set of background noise present in the input signal, b) producing adapted reference templates from the test feature set, the background noise feature set and the reference feature sets and c) determining match scores defining the match between each of the adapted reference templates and the test feature set. The method can also include adapting the scores before accepting a score as the result. The system and method are described for both Hidden Markov Model (HMM) and Dynamic Time Warping (DTW) scoring units. The system performs the steps of the method.


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