The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1998
Filed:
Dec. 26, 1996
Antonius J Bruijns, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus includes an X-ray image intensifier for deriving an optical image from an X-ray image. The optical image is picked up by means of an image pick-up apparatus which includes a correction unit which is arranged to form a dark image signal and to derive test image signals from the optical image. Correction values are derived on the basis of the test image signals and the dark image signal. The correction unit is arranged to form a dark image signal, to derive one or more test image signals from the optical image, and to derive the correction values from said test image signals and the dark image signal. The dark image signal is picked up in the absence of incident light on the image sensor. The test image signals have a signal level which represents brightness values of the optical image which have been amplified by individual gain values.