The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 1998

Filed:

Sep. 13, 1996
Applicant:
Inventor:

Xiaohua George He, Menlo Park, CA (US);

Assignee:

Honeywell-Measurex Corporation, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; F05B / ;
U.S. Cl.
CPC ...
364149 ; 36414808 ; 3641481 ; 364157 ; 36447103 ;
Abstract

A control system regulates a controlled process. A first controller receives at least a first input variable and a second input variable and produces at least a first control variable and a second control variable. A delay unifier associated with the first controller introduces a first delay to one of the first and second control variables, the first delay being determined as a function of a second delay associated with another of the first and second control variables, and outputs first and second control variables with unified delay. A processor models effects of the controlled process. The processor receives the delayed first and second control variables output by the first controller and produces estimated process output variables. A second controller processes a difference between measured process output variables and the estimated process output variables to correct for disturbances. The processed difference is added to the delayed first and second control variables output by the first controller, and the sum is received by the processor and the process being controlled.


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