The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1998
Filed:
Feb. 04, 1994
Joseph C Marron, Brighton, MI (US);
Environmental Research Institute of Michigan, Ann Arbor, MI (US);
Abstract
A system and method for three-dimensional imaging utilize a lens to perform a two-dimensional Fourier transform of an interference pattern while focusing the pattern on a two-dimensional detector array which is positioned in the image plane of the lens. This allows immediate previewing of the imaged object for proper positioning. Coherent energy beams are utilized to create a series of interference patterns, or image-plane holograms, each at a different frequency of the source energy beams. Furthermore, at each frequency, the relative phase between an object and a reference energy beam is varied to capture the complex values associated with the interference patterns. After capturing and storing the various interference patterns, a computer performs a one-dimensional Fourier transform, or other simplified processing to generate the three-dimensional image of the object. The image resolution extends to the micron range making this system and method easily adaptable to a variety of three-dimensional inspection applications.