The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1998
Filed:
Jan. 03, 1997
Frederick L Maltby, Jenkintown, PA (US);
Glen L Mitchell, Dresher, PA (US);
Mort Gorowitz, Syosset, NY (US);
Drexelbrook Controls, Inc., Horsham, PA (US);
Abstract
A high reliability instrument system includes means for applying a test condition to the instrument and for determining whether the instrument properly responds to the test condition, and means for inhibiting the generation of an instrument output in response to such testing. This provides verification that most of the instrument system components, but not the system output, are properly functioning. The system further includes means for overriding the output-inhibiting function when it is desired to test the entire instrument system including the system output. The instrument system may include a gap-type ultrasonic instrument, with the test condition comprising a pulse applied to one crystal, the effects of which are detected at the other crystal to determine sensor integrity. The system is preferably configured as a two-wire on-off instrument system, in which application of the test condition at a transmitter is controlled by signals applied to the two-wire signal loop at a remote receiver. The system may be implemented as a quasi-redundant system having radio frequency instrument and an ultrasonic instrument disposed to monitor the same condition, in which both instruments may be connected to a single type of receiver and tested in response to the same type of signal generated by such receiver.