The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1998
Filed:
Jul. 03, 1996
Yuji Hatagishi, Shizuoka, JP;
Toshihiko Yamamoto, Shizuoka, JP;
Kimihiro Abe, Shizuoka, JP;
Toshiaki Okabe, Shizuoka, JP;
Yazaki Corporation, Tokyo, JP;
Abstract
A connector conduction tester includes a conduction testing section and a connector holding section which are arranged on a stand frame and an operating section for moving the conducting testing section towards the connector holding section, in which a conduction testing operation is carried out with testing pins of the conduction testing section abutted against terminals in a connector. In the tester, the stand frame has a spacer supplying hole which is confronted with a spacer inserting hole formed in a connector set in the connector holding section, and spacer pushing device located below the spacer supplying hole. Furthermore, a conduction testing method in which a connector is set in a connector holding section and a conduction testing section is moved, so that the conduction of terminals in the connector is tested with testing pins, in which a spacer is supplied to a spacer supplying hole in a stand frame which hole is confronted with a spacer inserting hole formed in the connector, and when the connector is engaged with the conduction testing section, the spacer is pushed into the spacer inserting hole from the spacer supplying hole with the aid of pushing device.