The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
May. 03, 1994
Alessandro E Chiabrera, 16145 Genoa, IT;
Bruno Bianco, 16122 Genoa, IT;
Jonathan J Kaufman, Brooklyn, NY (US);
Other;
Abstract
An unknown object is non-destructively and quantitatively evaluated for three-dimensional spatial distribution of a set of material constitutive parameters, using a multi-element array-source transducer and a multi-element array-detector transducer in spaced, mutually facing relation. The array-source transducer exposes the array-detector transducer to a set of source-field patterns pursuant to a set of electrical input signals. Either a known object or an unknown object positioned between these transducers will be the cause of scattering, thus presenting a scattered-field pattern to the array detector transducer, for each pattern of the set of source-field patterns. A computer, a signal processor and a neural network operate from detector response to each set of scattered-field patterns, in each of two modes. In an initial mode, the neural network is 'trained' or configured to process a set of transfer functions involved in array-detector response to scattered-field patterns produced by the known object; in another mode, the neural network utilizes its 'trained' configuration in application to a set of transfer functions involved in array-detector response to scattered-field patterns produced by an unknown object, to generate estimates of the three-dimensional spatial distribution of the material constitutive parameters of the unknown object.