The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

Aug. 11, 1995
Applicant:
Inventors:

Shin-Ywan Wang, Tustin, CA (US);

Toshiaki Yagasaki, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382176 ; 382180 ;
Abstract

In an image processing system for processing image data which includes both text areas and non-text areas, a method for extracting image data by performing block selection to obtain circumscribing rectangles around each block of text type areas in the image data and around each block of non-text type areas in the image data, obtaining outline pairs for each text and non-text block, determining whether the circumscribing rectangles overlap, decomposing overlapped rectangles based on the outline pairs, extracting image data based on the circumscribing rectangles for non-overlapped rectangles and based on the decomposed rectangles for overlapped rectangles, and processing the extracted image data.


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