The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Jun. 13, 1996
Mitsuhiro Yanari, Mitaka, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An eyepiece lens suitable for use in microscopes, binoculars, and the like is disclosed. The eyepiece lens provides a large eye relief of more than 80 percent of the focal length of the eyepiece lens in an apparent field of view of more than 60 degrees, preferably more than 70 degrees, while favorably correcting various aberrations such as distortion up to the perimeter of the apparent field of view of the eyepiece lens. The eyepiece lens is disposed on the eye side of a real image plane of an objective lens with which the eyepiece lens is used, and comprises, in order from the objective side, a first cemented lens L.sub.1, preferably a doublet, a second cemented lens L.sub.2, preferably a doublet, a first positive lens element L.sub.3, and a second positive lens element L.sub.4. The eyepiece lens preferably satisfies a number of quantitative conditions.