The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Oct. 21, 1996
Hak-Kyu Lee, Daejeon, KR;
Kyong-Hon Kim, Daejeon, KR;
Seo-Yeon Park, Daejeon, KR;
El-Hang Lee, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
A measurement of nonlinear refractive index coefficient of an optical fiber with a Sagnac interferometer, comprises the steps of employing the optical fiber in a Sagnac interferometer, splitting a signal beam into two signals, launching the two split signals into the interferometer in opposite directions, combining and detecting the signals counter-propagated in the interferometer, and detecting the refractive index coefficient of the optical fiber in accordance with the difference between the two signal powers determined by a control beam. The quasi-static phase shift of the signal beam counter-propagating the same paths of the interferometer is induced by rotating the optical fiber loop of the interferometer. The present invention gives rise to little error because it does not require precise information about the pulse width of a used beam or a high-power light.