The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

Sep. 09, 1996
Applicant:
Inventors:

Miles John Padgett, Cambridge, GB;

Wilson Sibbett, St Andrews, GB;

Johannes Courtial, Veitschochheim, DE;

Brett Alexander Patterson, Norwood, AU;

Assignee:

Siemens plc, Bracknell, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356351 ;
Abstract

A Fourier transform spectrometer for use, among others, for sensing gases or liquids includes two polarizers, a birefringent optical component interposed between the two polarizers and a detector. Light from an extended source is substantially polarized by a first of the two polarizers, split into divergent beams by the birefringent optical component, and again caused to converge by the birefringent optical component so that, after passing through a second of the two polarizers, the light forms an interferogram in a plane behind the birefringent optical component where the detector is situated. The Fourier transform spectrometer is thereby provided with a way of forming an interferogram of the light from the extended source without a lens or a second birefringent optical component. This improves the field of view of the spectrometer and is likely to reduce its cost.


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