The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

Sep. 29, 1995
Applicant:
Inventors:

Jan B Wilstrup, Mounds View, MN (US);

Stanley Peter Mros, Roseville, MN (US);

Assignee:

Megatest Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324763 ;
Abstract

A power supply for testing an integrated circuit includes a source voltage input terminal for receiving an input voltage. The power supply serves as both a DUT active power supply and an IDDQ measurement circuit, without the need for switching between separate DUT active power supply and IDDQ measurement circuits. In one embodiment, a current source output driver includes a diode across a current sensing resistor inside a feedback loop. This minimizes VDD changes when the DUT demands transient current, such as when loading IDDQ test vectors. Moreover, with decreased transient changes in VDD, dielectric absorption effects of a decoupling capacitor are reduced.


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