The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Jan. 12, 1996
Kiichi Suyama, Yokohama, JP;
Hajime Furusawa, Tokyo, JP;
Yasuharu Hosohara, Yokohama, JP;
Takashi Kobori, Yokohama, JP;
Tokyo Gas Co., Ltd., Tokyo, JP;
Abstract
A method of inspecting an abnormality occurring inside a pipe to be inspected, and an apparatus for practicing the method, which includes the steps of transmitting an electric radio or radio frequency (RF) wave having a predetermined frequency from an antenna of a transmitter located at a predetermined position inside the pipe, receiving the transmitted RF wave by an antenna of a receiver located at a predetermined position inside the pipe, and discriminating a characteristic of the received RF wave. The characteristic of the received RF wave can be the intensity of the RF wave, and an attenuation amount is detected in a first example. Alternatively, the characteristic of the received RF wave may be the time required to reflect the transmitted RF wave and receive it with the receiver, and the time interval between transmission of the RF wave and reception of the reflected RF wave is measured in this alternative.