The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

Oct. 17, 1995
Applicant:
Inventors:

Masami Kishiro, Kawasaki, JP;

Keita Ohkawa, Kawasaki, JP;

Hironobu Yao, Kawasaki, JP;

Iwao Matsumoto, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
73861355 ;
Abstract

A mass flow meter provides improved accuracy in measuring the mass flow rate of a fluid flowing through a straight measuring tube. The as measured mass flow rate value is changed by parameters such as the Young's modules, second moment of area, length, axial force, etc. of the measuring tube. The parameters change with the strain caused in the axial direction of the measuring tube. A strain sensor is installed on a measuring tube, and the as measured mass flow rate is corrected based on the output of the strain sensor. Since the strain affects in a different way the substantial mass flow rate and the zero point offset, the correction is conducted separately on the substantial mass flow rate and on the zero point offset so that the accuracy of measurement may be improved. Since the parameters change also with the temperature of the measuring tube, a temperature sensor is also installed on the measuring tube so that the accuracy of measurement may be further improved.


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