The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

Jul. 30, 1996
Applicant:
Inventors:

Luigi Cantatore, White Plains, NY (US);

Jeff Busch, Katonah, NY (US);

Maurice J Epstein, Ardsley, NY (US);

Edward J Hetherington, Brewster, NY (US);

Assignee:

Bayer Corporation, Tarrytown, US;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 67 ; 436 50 ; 436164 ; 436179 ; 422 8205 ; 422116 ;
Abstract

An analytic instrument utilizing a Control Arena Network (CANBUS) and nodal architecture in the instrument with functions and logic distributed throughout the Nodes. A system controller is connected on the one hand to an operator input device for controlling the instrument, and on the other hand to a plurality of nodes via a CAN scrambler. Each nodes has a CAN microcontroller and related circuitry for performing autonomously a variety of functions of the instrument. The system controller and nodes communicate using CAN interface devices over the CANBUS, passing instructions, commands and data therebetween.


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