The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1998

Filed:

May. 09, 1996
Applicant:
Inventors:

Igal Nevo, Bala Cynwyd, PA (US);

Maher Salah, Philadelphia, PA (US);

Srinivas S Dagalur, Philadelphia, PA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600483 ; 600484 ; 600481 ; 600529 ;
Abstract

An apparatus and method for monitoring a system or patient to provide information regarding the status of the system. The apparatus transforms measured values of more than one parameter of the system using a function dependent on at least baseline and critical values of the parameters. The apparatus further includes mapping means for mapping the function to a sequence of reference values and generating a deviation indicator for each parameter. The deviation indicators are analyzed by an analyzer to generate information concerning the status of the system or patient.


Find Patent Forward Citations

Nevo, Igal. (1998). Apparatus and method for monitoring a system (U.S. Patent No. 5772599). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5772599

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