The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Oct. 26, 1994
Ralph A Felice, Macedonia, OH (US);
Other;
Abstract
The present invention relates to a totally novel device and process useful for the measurement of the temperature of a radiating body. More particularly, the present invention relates to a device that enhances the resolution and repeatability of the measured temperature of the radiating body by fitting a mathematical correlation to the emitted radiation spectra, generating calculated radiation intensities at specified wavelengths using the mathematical correlation, and then generating a suite of individual two-wavelength temperature values, which can be statistically evaluated and averaged for a final, measured temperature. In one embodiment, the device consists of an optical input system which receives a portion of the emitted radiation of a radiating body; a wavelength dispersion device which separates the emitted radiation according to wavelength; a radiation transducer which senses the separated radiation and provides an output corresponding to the respective wavelengths of the emitted radiation; means for generating a mathematical function to correlate the output of the radiation transducer to the corresponding wavelengths of incident radiation; and a means for generating a temperature value utilizing a form of the Planck Radiation Equation. Additionally, the present invention relates to the technique utilized to enhance the resolution and repeatability of the measured temperature.