The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 1998
Filed:
Jun. 17, 1994
Applicant:
Inventors:
Yujiro Nomura, Nagano, JP;
Takashi Suzuki, Nagano, JP;
Kyu Takada, Nagano, JP;
Nozomu Inoue, Nagano, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J / ; G01D / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
347257 ; 347259 ; 347260 ;
Abstract
The improved beam scanning apparatus has an optical element that is driven to rotate by means of a drive means so as to be capable of continuous angular displacement with respect to the beam from a light source. The optical element deflects the incident beam so that it is focused to form image on the image plane. It is provided with an entrance face, a reflecting face and an exit face which have their shape specified in such a way as to achieve effective correction of aberration, provide higher resolution, and reduce the size and cost of the apparatus.