The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 1998

Filed:

Dec. 06, 1995
Applicant:
Inventor:

William A Meredith, Jr, Faribault, MN (US);

Assignee:

Viratec Thin Films, Inc., Faribault, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356445 ;
Abstract

An optical analyzer measuring the reflectivity of a moving article in an in-line sputtering deposition system. The optical analyzer includes a light source which provides a light beam. Light is reflected from an optical coating of a moving article into a concentrator, which captures and directs the reflected light to a detector. The analyzer may be mounted in an evacuable chamber in which the end walls have openings to allow passage of the article.


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