The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 1998
Filed:
Nov. 27, 1996
Seiji Yamaguchi, Sagamihara, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A phase difference measuring apparatus obtains a first receive signal by transmitting and receiving a to-be-measured material in a reference state and a second receive signal by transmitting and receiving a signal wave to and from that material in a measured state. The apparatus finds a reference phase difference .theta..sub.1 from the transmit wave and first receive signal and an apparent phase difference .theta..sub.2 ' from the transmit wave and second receive signal. The apparatus adds the apparent phase difference .theta..sub.2 ' to a product of the number of rotations, n, the apparent phase difference .theta..sub.2 ' passes through a given reference point and an angle of 360.degree. to find a true phase difference .theta..sub.2. The apparatus varies the number of rotations, n, to n+1 when the apparent phase difference .theta..sub.2 ', while being increased, passes through the reference point and that number of rotations, n, to n=n-1 when the apparent phase difference .theta..sub.2 ', while being decreased, passes through the reference point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile