The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 1998

Filed:

Sep. 27, 1996
Applicant:
Inventors:

Eric A Lindgren, Gaithersburg, MD (US);

Moshe Rosen, Rockville, MD (US);

Harold Berger, Gaithersburg, MD (US);

Assignee:

Industrial Quality, Inc., Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73597 ; 73602 ; 310336 ;
Abstract

In a method for obtaining near-surface characteristics of a material, a broadband ultrasonic Rayleigh wave including a plurality of components is generated, with a generating system, in the material. The Rayleigh wave is detected with a detection system remote from the generating station. The detected Rayleigh wave is filtered to obtain selected ones of the plurality of components of the detected Rayleigh wave at selected frequencies. Velocities of the selected components of the detected Rayleigh wave are determined at the selected frequencies. A system for obtaining near-surface characteristics of a material is also disclosed.


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