The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 1998
Filed:
Nov. 20, 1995
Applicant:
Inventor:
Raymond Leon Cybulski, Elkton, MD (US);
Assignee:
Dade International Inc., Deerfield, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435 22 ; 435210 ;
Abstract
A method for increasing the accuracy of photometric-based assays for .alpha.-amylase by subjecting a sample to a secondary interrogating beam of radiation at a wavelength distinguishable from a primary interrogating beam of radiation. The secondary interrogating beam of radiation is indicative of an interfering reaction occurring in the absence of analyte at the primary wavelength. The secondary wavelength is outside the absorption spectrum of the analyte of interest. This secondary radiation beam's absorption is proportional to the interfering reaction at the primary wavelength.