The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 1998

Filed:

Feb. 26, 1996
Applicant:
Inventor:

Yukio Sai, Tokorozawa, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
374161 ; 374137 ; 25022714 ;
Abstract

In a light-temperature distribution sensor, Raman scattering light is extracted from back scattering light produced by a light pulse supplied into an optical fiber, thereby calculating a temperature distribution. An intensity distribution signal of anti-Stokes Raman scattering light is extracted from the back scattering light. An intensity distribution signal of Stokes Raman scattering light is extracted from the back scattering light. An intensity distribution signal of Rayleigh scattering light is extracted from the back scattering light. The intensity distribution signal of the anti-Stokes Raman scattering light and the intensity distribution signal of the Stokes Raman scattering light are normalized, with the intensity distribution signal of the Rayleigh scattering light used as reference signal. A temperature distribution on the light transmission medium is calculated on the basis of the value of a product of the normalized intensity distribution signals of the anti-Stokes Raman scattering light and the Stokes Raman scattering light.


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