The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1998

Filed:

Apr. 26, 1996
Applicant:
Inventors:

Kerin John Flannery, Endicott, NY (US);

Philip David Heinlein, Binghamton, NY (US);

Carl Frank Ingersoll, Endwell, NY (US);

James Allen Martin, Jr, Endicott, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395610 ; 395 54 ; 395500 ; 395604 ; 395683 ; 364552 ;
Abstract

A network application for automatically formatting and printing documents to be used as planning manuals to be used by company personnel for improving quality control. The outputted documents can also be educational manuals for dispersing among organizational personnel common information for integrated strategic planning for quality control improvement. Facilitated collaborative work sessions among work groups inputting and sharing comments and ideas provide starting data to the network application.


Find Patent Forward Citations

Quick Actions:

Flannery, Kerin. (1998). Integration of groupware with the integrated quality control methodology (U.S. Patent No. 5765038). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5765038

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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