The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1998
Filed:
Sep. 10, 1996
Steven Gerdt, San Jose, CA (US);
M Jaishankar Menon, San Jose, CA (US);
Dung Kim Nguyen, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for rebuilding contents of a malfunctioned direct access storage device within a log-structured array is disclosed. In accordance with the method and system of the present invention, each direct access storage device within a log-structured array is divided into multiple segment-columns, and each corresponding segment-column from each direct access storage device within the log-structured array forms a segment. A segment is first located within the direct access storage devices. A determination is made as to whether or not the segment is empty. In response to a determination that the segment is empty, a pointer is moved within a segment-column mapping table from pointing to a segment-column in the malfunctioned direct access storage device to point to a segment-column in a spare direct access storage device of the segment. In response to a determination that the segment is not empty, rebuilding contents of the segment-column in the malfunctioned direct access storage device to the segment-column in the spare direct access storage device, and moving the pointer within the segment-column mapping table from pointing to the segment-column in the malfunctioned direct access storage device to point to the segment-column in the spare direct access storage device of the segment. The process then returns to the determination step until all segment-columns within the malfunctioned direct access storage device are rebuilt.