The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1998

Filed:

Nov. 08, 1996
Applicant:
Inventor:

Yukio Sakano, Fuchu, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; H04N / ;
U.S. Cl.
CPC ...
382261 ; 382275 ; 358462 ; 358468 ;
Abstract

An image processing apparatus includes a plurality of detecting units each of which detects whether binary signals derived from picture elements of image data match with one of a plurality of patterns of isolated dots, the detecting units generating a plurality of detection signals which are set based on respective results of the detections with respect to the isolated-dot patterns, wherein the isolated-dot patterns are different from each other in the number of isolated dots included in each pattern, the isolated-dot patterns having respective sizes predetermined for isolated-dot removing function levels. A selecting unit selects one of the isolated-dot removing function levels in response to an operation control signal, the selecting unit generating an isolated-dot signal which is set for each picture element based on the detection signals by the selected isolated-dot removing function level. An operation control part inputs the operation control signal to the selecting unit in accordance with a setting by an operator with respect to one of the isolated-dot removing function levels.


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